{"title":"一种容错多端口关联内存方案","authors":"L. Dadda, M. Sami, R. Stefanelli","doi":"10.1109/ICWSI.1993.255271","DOIUrl":null,"url":null,"abstract":"A multiport associative memory allowing independent and simultaneous access from the two ports is described. The device is conceived as part of a complex digital system designed for calorimetry at CERN's large Hadron Collider, so that system requirements dictate functional specification of the memory. Ad hoc fault tolerance policies, supporting both permanent and transient fault treatment, are introduced to account for the severe environment in which the system will operate.<<ETX>>","PeriodicalId":377227,"journal":{"name":"1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A fault-tolerant multi-port associative memory scheme\",\"authors\":\"L. Dadda, M. Sami, R. Stefanelli\",\"doi\":\"10.1109/ICWSI.1993.255271\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A multiport associative memory allowing independent and simultaneous access from the two ports is described. The device is conceived as part of a complex digital system designed for calorimetry at CERN's large Hadron Collider, so that system requirements dictate functional specification of the memory. Ad hoc fault tolerance policies, supporting both permanent and transient fault treatment, are introduced to account for the severe environment in which the system will operate.<<ETX>>\",\"PeriodicalId\":377227,\"journal\":{\"name\":\"1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-01-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICWSI.1993.255271\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1993.255271","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A fault-tolerant multi-port associative memory scheme
A multiport associative memory allowing independent and simultaneous access from the two ports is described. The device is conceived as part of a complex digital system designed for calorimetry at CERN's large Hadron Collider, so that system requirements dictate functional specification of the memory. Ad hoc fault tolerance policies, supporting both permanent and transient fault treatment, are introduced to account for the severe environment in which the system will operate.<>