{"title":"利用样条函数的原因不断地描述了计量指标ORF的计量特征","authors":"S. Sibirtsev, S. V. Romas’ko, A. Palchun","doi":"10.1109/APEIE.2014.7040888","DOIUrl":null,"url":null,"abstract":"In report are considered questions of the unceasing description of the metrological features of the measures ORF on source discrete ensemble result measurements.","PeriodicalId":202524,"journal":{"name":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using spline-function for the reason unceasing description of the metrological features of the measures ORF\",\"authors\":\"S. Sibirtsev, S. V. Romas’ko, A. Palchun\",\"doi\":\"10.1109/APEIE.2014.7040888\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In report are considered questions of the unceasing description of the metrological features of the measures ORF on source discrete ensemble result measurements.\",\"PeriodicalId\":202524,\"journal\":{\"name\":\"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEIE.2014.7040888\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEIE.2014.7040888","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Using spline-function for the reason unceasing description of the metrological features of the measures ORF
In report are considered questions of the unceasing description of the metrological features of the measures ORF on source discrete ensemble result measurements.