X架构的基于平分的布局

S. Ono, S. Tilak, P. Madden
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引用次数: 3

摘要

不断上升的互连延迟和功耗激发了对替代集成电路路由架构的研究。特别是X架构,其优先采用对角线方向的布线,已经获得了一定程度的行业支持,甚至已经在65nm上进行了验证。虽然对曼哈顿设计方法进行了广泛的研究,但对非曼哈顿设计的研究结果却明显较少。为了帮助填补这一空白,我们研究了X架构的专利放置方法;据我们所知,之前还没有发表过关于该方法的结果。令人惊讶的是,我们发现专利方法实际上比传统的曼哈顿方法表现更差-无论是曼哈顿还是X路由指标。我们还提出了一个解释溶液质量下降的理论公式。工业界的许多团体正在评估非曼哈顿路由架构的优点。我们希望通过提供具体的实验结果来提高这些评价的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Bisection Based Placement for the X Architecture
Rising interconnect delay and power consumption have motivated the investigation of alternative integrated circuit routing architectures. In particular, the X architecture, which features preferred routing in diagonal directions, has gained a measure of industry support, and has even been validated at 65nm. While there has been extensive study of Manhattan design methods, there are markedly fewer published results for non-Manhattan design. To help fill this gap, we study a patented placement method for the X architecture; to our knowledge, there have been no prior published results for the method. Surprisingly, we find that the patented method in fact performs worse than traditional Manhattan methods - for both Manhattan and X routing metrics. We also present a theoretic formulation which explains why solution quality is degraded. Many groups in industry are evaluating the merits of non-Manhattan routing architectures. By providing concrete experimental results, we hope to improve the accuracy of these evaluations.
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