Yigong Zhang, B. Quiter, P. Barton, B. Plimley, K. Vetter, C. Geddes
{"title":"基于ccd的脉冲MeV光子束诊断","authors":"Yigong Zhang, B. Quiter, P. Barton, B. Plimley, K. Vetter, C. Geddes","doi":"10.1109/NSSMIC.2014.7431240","DOIUrl":null,"url":null,"abstract":"Narrow bandwidth, MeV-level photon beams can be generated by Thomson scattering of laser light from fast electrons. Intense photon sources (> 1 MeV, 108 photons/shot) from laser plasma accelerated GeV electrons present the possibility for compact active interrogation devices. However, the characterization of such intense photon beams is inherently challenging due to mm-scale focusing and fs-scale pulse duration. A solution to the characterization of both spatial and energy distributions of each shot is to employ a low mass scattering material and track the scattered Compton electron's direction and energy. Following previous work at UC Berkeley with electron track Compton imaging in fully-depleted silicon CCDs, we present a measurement scheme for the shot-by-shot measurement of MeV photon beam position and energy.","PeriodicalId":144711,"journal":{"name":"2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"CCD-based diagnostics for pulsed MeV photon beams\",\"authors\":\"Yigong Zhang, B. Quiter, P. Barton, B. Plimley, K. Vetter, C. Geddes\",\"doi\":\"10.1109/NSSMIC.2014.7431240\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Narrow bandwidth, MeV-level photon beams can be generated by Thomson scattering of laser light from fast electrons. Intense photon sources (> 1 MeV, 108 photons/shot) from laser plasma accelerated GeV electrons present the possibility for compact active interrogation devices. However, the characterization of such intense photon beams is inherently challenging due to mm-scale focusing and fs-scale pulse duration. A solution to the characterization of both spatial and energy distributions of each shot is to employ a low mass scattering material and track the scattered Compton electron's direction and energy. Following previous work at UC Berkeley with electron track Compton imaging in fully-depleted silicon CCDs, we present a measurement scheme for the shot-by-shot measurement of MeV photon beam position and energy.\",\"PeriodicalId\":144711,\"journal\":{\"name\":\"2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.2014.7431240\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.2014.7431240","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Narrow bandwidth, MeV-level photon beams can be generated by Thomson scattering of laser light from fast electrons. Intense photon sources (> 1 MeV, 108 photons/shot) from laser plasma accelerated GeV electrons present the possibility for compact active interrogation devices. However, the characterization of such intense photon beams is inherently challenging due to mm-scale focusing and fs-scale pulse duration. A solution to the characterization of both spatial and energy distributions of each shot is to employ a low mass scattering material and track the scattered Compton electron's direction and energy. Following previous work at UC Berkeley with electron track Compton imaging in fully-depleted silicon CCDs, we present a measurement scheme for the shot-by-shot measurement of MeV photon beam position and energy.
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