Takuya Shijo, Shinya Kurachi, Yujiro Noda, H. Yamada, Toshihiko Tanaka
{"title":"400 kHz sic - mosfet高频逆变器，用于微小外来金属颗粒检测","authors":"Takuya Shijo, Shinya Kurachi, Yujiro Noda, H. Yamada, Toshihiko Tanaka","doi":"10.1109/SPEC.2016.7846181","DOIUrl":null,"url":null,"abstract":"This paper presents the detection of small-foreign-metal particles using a 400 kHz SiC-MOSFETs high-frequency inverter. A 400 kHz SiC-MOSFETs high-frequency inverter is constructed and tested, and then applied to the small-foreign-metal particles detection on high-performance chemical films (HPCFs) with induction heating (IH). Experimental results demonstrate that the developed 400 kHz SiC-MOSFETs high-frequency inverter can heat small-foreign-metal particle on HPCFs with IH. Thus, small-foreign-metal particle can be detected with the help of a thermographic camera along with the constructed 400 kHz SiC-MOSFETs high-frequency inverter. Losses caused by SiC-MOSFETs are analyzed in detail to improve power conversion efficiency of the constructed high-frequency inverter. Experimental results also demonstrate that parallel connections of two SiC-MOSFETs effectively reduces the losses, where power conversion efficiency is 96.8 % and improved by 1.9 %.","PeriodicalId":403316,"journal":{"name":"2016 IEEE 2nd Annual Southern Power Electronics Conference (SPEC)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A 400 kHz SiC-MOSFETs high-frequency inverter for small-foreign-metal particle detection\",\"authors\":\"Takuya Shijo, Shinya Kurachi, Yujiro Noda, H. Yamada, Toshihiko Tanaka\",\"doi\":\"10.1109/SPEC.2016.7846181\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the detection of small-foreign-metal particles using a 400 kHz SiC-MOSFETs high-frequency inverter. A 400 kHz SiC-MOSFETs high-frequency inverter is constructed and tested, and then applied to the small-foreign-metal particles detection on high-performance chemical films (HPCFs) with induction heating (IH). Experimental results demonstrate that the developed 400 kHz SiC-MOSFETs high-frequency inverter can heat small-foreign-metal particle on HPCFs with IH. Thus, small-foreign-metal particle can be detected with the help of a thermographic camera along with the constructed 400 kHz SiC-MOSFETs high-frequency inverter. Losses caused by SiC-MOSFETs are analyzed in detail to improve power conversion efficiency of the constructed high-frequency inverter. Experimental results also demonstrate that parallel connections of two SiC-MOSFETs effectively reduces the losses, where power conversion efficiency is 96.8 % and improved by 1.9 %.\",\"PeriodicalId\":403316,\"journal\":{\"name\":\"2016 IEEE 2nd Annual Southern Power Electronics Conference (SPEC)\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 2nd Annual Southern Power Electronics Conference (SPEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPEC.2016.7846181\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 2nd Annual Southern Power Electronics Conference (SPEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPEC.2016.7846181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
摘要
本文介绍了一种利用400 kHz sic - mosfet高频逆变器检测微小外来金属颗粒的方法。构建并测试了400 kHz sic - mosfet高频逆变器，并将其应用于感应加热的高性能化学薄膜(HPCFs)上的微小外来金属颗粒检测。实验结果表明，所研制的400 kHz sic - mosfet高频逆变器可以对HPCFs上的微小外来金属颗粒进行IH加热。因此，借助热像仪以及构建的400 kHz sic - mosfet高频逆变器，可以检测到小的外来金属颗粒。为了提高所构建的高频逆变器的功率转换效率，详细分析了硅基mosfet的损耗。实验结果还表明，两个sic - mosfet并联可有效降低损耗，功率转换效率为96.8%，提高1.9%。
A 400 kHz SiC-MOSFETs high-frequency inverter for small-foreign-metal particle detection
This paper presents the detection of small-foreign-metal particles using a 400 kHz SiC-MOSFETs high-frequency inverter. A 400 kHz SiC-MOSFETs high-frequency inverter is constructed and tested, and then applied to the small-foreign-metal particles detection on high-performance chemical films (HPCFs) with induction heating (IH). Experimental results demonstrate that the developed 400 kHz SiC-MOSFETs high-frequency inverter can heat small-foreign-metal particle on HPCFs with IH. Thus, small-foreign-metal particle can be detected with the help of a thermographic camera along with the constructed 400 kHz SiC-MOSFETs high-frequency inverter. Losses caused by SiC-MOSFETs are analyzed in detail to improve power conversion efficiency of the constructed high-frequency inverter. Experimental results also demonstrate that parallel connections of two SiC-MOSFETs effectively reduces the losses, where power conversion efficiency is 96.8 % and improved by 1.9 %.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
