{"title":"采用分段p基的横向双通道发射极开关晶闸管","authors":"D. Byeon, J. Oh, M. Han, Y. Choi","doi":"10.1109/ISPSD.1999.764100","DOIUrl":null,"url":null,"abstract":"A new lateral dual channel emitter switched thyristor employing segmented p-base, entitled the lateral SB-DCEST, is proposed in order to eliminate the snap-back and to decrease the forward voltage drop. The forward I-V characteristics of the fabricated lateral SB-DCEST show that the snap-back problem is almost eliminated and a lower forward voltage drop by 1 V is obtained when compared with the conventional lateral DCEST due to the enhanced thyristor operation.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"216 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Lateral dual channel emitter switched thyristor employing segmented p-base\",\"authors\":\"D. Byeon, J. Oh, M. Han, Y. Choi\",\"doi\":\"10.1109/ISPSD.1999.764100\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new lateral dual channel emitter switched thyristor employing segmented p-base, entitled the lateral SB-DCEST, is proposed in order to eliminate the snap-back and to decrease the forward voltage drop. The forward I-V characteristics of the fabricated lateral SB-DCEST show that the snap-back problem is almost eliminated and a lower forward voltage drop by 1 V is obtained when compared with the conventional lateral DCEST due to the enhanced thyristor operation.\",\"PeriodicalId\":352185,\"journal\":{\"name\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"volume\":\"216 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1999.764100\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764100","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new lateral dual channel emitter switched thyristor employing segmented p-base, entitled the lateral SB-DCEST, is proposed in order to eliminate the snap-back and to decrease the forward voltage drop. The forward I-V characteristics of the fabricated lateral SB-DCEST show that the snap-back problem is almost eliminated and a lower forward voltage drop by 1 V is obtained when compared with the conventional lateral DCEST due to the enhanced thyristor operation.