倒装芯片上的FR-4集成电路封装

D. Powell, A. K. Trivedi
{"title":"倒装芯片上的FR-4集成电路封装","authors":"D. Powell, A. K. Trivedi","doi":"10.1109/ECTC.1993.346722","DOIUrl":null,"url":null,"abstract":"Technology advances have made it possible to extend the IBM C4 (Controlled Collapse Chip Connection) IC attachment method, also known as flip-chip, to printed circuit boards with low-cost dielectrics, such as FR-4. This new technology is referred to as Flip Chip Attach (FCA). In the past, C4 attachment had been limited to ceramic substrates due to the high temperature (360/spl deg/C) required to renew the low tin solder on the chips, and the need for the substrate to have its thermal expansion relatively closely matched to that of the silicon chip. The development of methods to deposit uniform, small (approximately 1/spl times/10/sup -3/ mm/sup 3/) volumes of eutectic tin/lead solder on printed circuit cards has allowed C4 bumped chips to be reflow soldered to the cards using standard SMT joining time/temperature profiles. The high melt (3-5% tin, balance lead) solder bump on the chip is used simply as a solder wettable device lead in this case. The resulting solder joint is not a true controlled collapse joint, but the process still maintains the self-aligning characteristic of C4, due to the surface tension of the molten eutectic solder and the low mass of the chip. The other enabling technology development for FCA is the use of a controlled expansion epoxy encapsulant between the chip and the substrate to minimize the cyclic strain on the solder joints induced by thermal expansion mismatch between the silicon chip and the FR-4 card. Without the use of such an encapsulant, the thermal cycle fatigue life of the FCA joints would be totally unacceptable, and the technology would be useless. In this paper we will explain how the enabling technologies work to make FCA a viable packaging method, and present reliability data for several different chips using FCA packaging.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"171 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":"{\"title\":\"Flip-chip on FR-4 integrated circuit packaging\",\"authors\":\"D. Powell, A. K. Trivedi\",\"doi\":\"10.1109/ECTC.1993.346722\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Technology advances have made it possible to extend the IBM C4 (Controlled Collapse Chip Connection) IC attachment method, also known as flip-chip, to printed circuit boards with low-cost dielectrics, such as FR-4. This new technology is referred to as Flip Chip Attach (FCA). In the past, C4 attachment had been limited to ceramic substrates due to the high temperature (360/spl deg/C) required to renew the low tin solder on the chips, and the need for the substrate to have its thermal expansion relatively closely matched to that of the silicon chip. The development of methods to deposit uniform, small (approximately 1/spl times/10/sup -3/ mm/sup 3/) volumes of eutectic tin/lead solder on printed circuit cards has allowed C4 bumped chips to be reflow soldered to the cards using standard SMT joining time/temperature profiles. The high melt (3-5% tin, balance lead) solder bump on the chip is used simply as a solder wettable device lead in this case. The resulting solder joint is not a true controlled collapse joint, but the process still maintains the self-aligning characteristic of C4, due to the surface tension of the molten eutectic solder and the low mass of the chip. The other enabling technology development for FCA is the use of a controlled expansion epoxy encapsulant between the chip and the substrate to minimize the cyclic strain on the solder joints induced by thermal expansion mismatch between the silicon chip and the FR-4 card. Without the use of such an encapsulant, the thermal cycle fatigue life of the FCA joints would be totally unacceptable, and the technology would be useless. In this paper we will explain how the enabling technologies work to make FCA a viable packaging method, and present reliability data for several different chips using FCA packaging.<<ETX>>\",\"PeriodicalId\":281423,\"journal\":{\"name\":\"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)\",\"volume\":\"171 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"47\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1993.346722\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346722","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 47

摘要

技术的进步使得将IBM C4(受控折叠芯片连接)IC连接方法(也称为倒装芯片)扩展到具有低成本电介质的印刷电路板(如FR-4)成为可能。这种新技术被称为倒装芯片连接(FCA)。在过去,由于更新芯片上的低锡焊料需要高温(360/spl°C),并且需要衬底的热膨胀与硅芯片的热膨胀相对紧密匹配,因此C4附着仅限于陶瓷衬底。在印刷电路上沉积均匀、小体积(约1/spl倍/10/sup -3/ mm/sup 3/)共晶锡/铅焊料的方法的发展,使得C4凸片可以使用标准的SMT连接时间/温度曲线回流焊到卡上。在这种情况下,芯片上的高熔点(3-5%锡,平衡铅)焊点仅用作可焊湿设备引线。由此产生的焊点并不是一个真正的可控塌陷焊点,但由于熔融共晶焊点的表面张力和芯片的低质量,该工艺仍然保持了C4的自对准特性。FCA的另一项技术开发是在芯片和基板之间使用可控膨胀环氧树脂密封剂,以最大限度地减少由硅芯片和FR-4卡之间的热膨胀不匹配引起的焊点循环应变。如果不使用这种密封剂,FCA接头的热循环疲劳寿命将是完全不可接受的,该技术将是无用的。在本文中,我们将解释使能技术如何使FCA成为可行的封装方法,并提供使用FCA封装的几种不同芯片的可靠性数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Flip-chip on FR-4 integrated circuit packaging
Technology advances have made it possible to extend the IBM C4 (Controlled Collapse Chip Connection) IC attachment method, also known as flip-chip, to printed circuit boards with low-cost dielectrics, such as FR-4. This new technology is referred to as Flip Chip Attach (FCA). In the past, C4 attachment had been limited to ceramic substrates due to the high temperature (360/spl deg/C) required to renew the low tin solder on the chips, and the need for the substrate to have its thermal expansion relatively closely matched to that of the silicon chip. The development of methods to deposit uniform, small (approximately 1/spl times/10/sup -3/ mm/sup 3/) volumes of eutectic tin/lead solder on printed circuit cards has allowed C4 bumped chips to be reflow soldered to the cards using standard SMT joining time/temperature profiles. The high melt (3-5% tin, balance lead) solder bump on the chip is used simply as a solder wettable device lead in this case. The resulting solder joint is not a true controlled collapse joint, but the process still maintains the self-aligning characteristic of C4, due to the surface tension of the molten eutectic solder and the low mass of the chip. The other enabling technology development for FCA is the use of a controlled expansion epoxy encapsulant between the chip and the substrate to minimize the cyclic strain on the solder joints induced by thermal expansion mismatch between the silicon chip and the FR-4 card. Without the use of such an encapsulant, the thermal cycle fatigue life of the FCA joints would be totally unacceptable, and the technology would be useless. In this paper we will explain how the enabling technologies work to make FCA a viable packaging method, and present reliability data for several different chips using FCA packaging.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信