碲化镉薄膜中光电驻极体状态的捕获水平参数的测定

G. A. Nabiev
{"title":"碲化镉薄膜中光电驻极体状态的捕获水平参数的测定","authors":"G. A. Nabiev","doi":"10.1117/12.742644","DOIUrl":null,"url":null,"abstract":"In the paper, an ability of determination of capture levels parameters, which are responsible for photoelectret state using relaxation curves in silver-doped cadmium telluride films have been studied.","PeriodicalId":160828,"journal":{"name":"International Conference on Photoelectronics and Night Vision Devices","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determination of capture levels parameters responsible for photoelectret state in cadmium telluride films\",\"authors\":\"G. A. Nabiev\",\"doi\":\"10.1117/12.742644\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the paper, an ability of determination of capture levels parameters, which are responsible for photoelectret state using relaxation curves in silver-doped cadmium telluride films have been studied.\",\"PeriodicalId\":160828,\"journal\":{\"name\":\"International Conference on Photoelectronics and Night Vision Devices\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Photoelectronics and Night Vision Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.742644\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Photoelectronics and Night Vision Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.742644","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文研究了利用松弛曲线测定掺银碲化镉薄膜中光电驻极体状态的俘获能级参数的能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Determination of capture levels parameters responsible for photoelectret state in cadmium telluride films
In the paper, an ability of determination of capture levels parameters, which are responsible for photoelectret state using relaxation curves in silver-doped cadmium telluride films have been studied.
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