随机粗糙接触面电阻的分形曲面建模

Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts Pub Date : 1900-01-01 DOI:10.1109/HOLM.1991.170806

M. Singer, K. Kshonze

{"title":"随机粗糙接触面电阻的分形曲面建模","authors":"M. Singer, K. Kshonze","doi":"10.1109/HOLM.1991.170806","DOIUrl":null,"url":null,"abstract":"A method for calculating electrical contact resistance utilizing fractal geometry is described. The base model is a modified version of the model of A. Maujamdar and C.L. Tien (1989), which calculates the bulk resistance of a structure of cumulative multilevel asperities. This updated model is then further extended to include the effect of constriction resistance. Two existing models, given by J.A. Greenwood and J.B.P. Williamson (1966), and M.M. Yovanovich (1981), are reviewed and compared numerically to the proposed model. This comparison shows good agreement among the three approaches.<<ETX>>","PeriodicalId":368900,"journal":{"name":"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"Electrical resistance of random rough contacting surfaces using fractal surface modeling\",\"authors\":\"M. Singer, K. Kshonze\",\"doi\":\"10.1109/HOLM.1991.170806\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method for calculating electrical contact resistance utilizing fractal geometry is described. The base model is a modified version of the model of A. Maujamdar and C.L. Tien (1989), which calculates the bulk resistance of a structure of cumulative multilevel asperities. This updated model is then further extended to include the effect of constriction resistance. Two existing models, given by J.A. Greenwood and J.B.P. Williamson (1966), and M.M. Yovanovich (1981), are reviewed and compared numerically to the proposed model. This comparison shows good agreement among the three approaches.<<ETX>>\",\"PeriodicalId\":368900,\"journal\":{\"name\":\"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1991.170806\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1991.170806","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 18

摘要

描述了一种利用分形几何计算电接触电阻的方法。基础模型是a . Maujamdar和C.L. Tien(1989)模型的修改版本，该模型计算了累积多层凸起结构的体阻力。这个更新的模型然后进一步扩展到包括收缩阻力的影响。本文回顾了J.A. Greenwood和J.B.P. Williamson(1966)以及M.M. Yovanovich(1981)给出的两个现有模型，并将其与所提出的模型进行了数值比较。这个比较表明这三种方法之间有很好的一致性。

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Electrical resistance of random rough contacting surfaces using fractal surface modeling

A method for calculating electrical contact resistance utilizing fractal geometry is described. The base model is a modified version of the model of A. Maujamdar and C.L. Tien (1989), which calculates the bulk resistance of a structure of cumulative multilevel asperities. This updated model is then further extended to include the effect of constriction resistance. Two existing models, given by J.A. Greenwood and J.B.P. Williamson (1966), and M.M. Yovanovich (1981), are reviewed and compared numerically to the proposed model. This comparison shows good agreement among the three approaches.<>

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Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts

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