先进半导体光刻胶专利信息公开的技术趋势与特点

Kosuke Watahiki, Y. Midoh, Kazuya Okamoto
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引用次数: 1

摘要

本文以先进半导体光阻剂为研究对象,从以下四个方面对专利数据进行了分析:半导体趋势与光阻剂的关系;光刻胶行业利润增长情况;先进极紫外光刻技术趋势与可持续发展目标(SDGs);以及光刻胶的专利质量和申请趋势。因此,我们得到了半导体光阻剂准确反映小型化的趋势及其与可持续发展目标的关系。此外,还得出了专利质量和信息披露特征的准则。光刻胶是半导体工业小型化的重要组成部分,专利是研究这一趋势的有效工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Technology Trends and Characteristics of Patent Information Disclosure in Advanced Semiconductor Photoresist
This paper focuses on advanced semiconductor photoresists and analyzes the patent data from the following four perspectives: relationship between semiconductor trends and resists; profit gains of the photoresist industry; advanced extreme ultraviolet lithography trends and sustainable development goals (SDGs); and patent quality and filing trends for photoresists. As a result, we obtain the trend of semiconductor photoresists accurately reflecting miniaturization and its relation to SDGs. In addition, a guideline for patent quality and information disclosure characteristics is obtained. Photoresist is a crucial component of the semiconductor industry in miniaturization, and patents are an effective application tool for the trend investigation.
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