表征MEMS可变形镜开环操作:薄板行为的高分辨率测量

SPIE MOEMS-MEMS Pub Date : 2008-02-07 DOI:10.1117/12.773555
K. Morzinski, D. Gavel, A. Norton, D. Dillon, M. Reinig
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引用次数: 18

摘要

利用微机电系统(MEMS)可变形镜(dm)实现天文自适应光学的新概念。与现在用于天文AO系统的传统dm不同,MEMS器件更小,更便宜,并且具有非凡的可重复驱动。因此,MEMS技术允许新的配置,如多对象AO,需要多个dm的开环控制。在UCO/Lick自适应光学天文台实验室,我们正在通过为MEMS DM创建相位电压模型来实现这一概念。我们通过薄板方程近似地模拟表面偏转。利用这种建模技术,我们已经在实验室中实现了开环控制精度,在响应~1-3 μm峰谷命令时,表面均方根分别达到~13-30 nm。接下来,将执行器杆间位移的高分辨率测量值与薄板方程的齐次解进行比较,以验证模型的有效性。这些测量表明,薄板方程似乎是一种合理的方法来模拟上表面的变形,直到十分之一的驱动器间距的横向尺度。最后,为了确定我们的模型可以期望准确的物理下限,我们用MEMS进行了一组滞后实验。我们在160伏环路上仅检测到亚纳米量的0.6±0.3 nm表面迟滞。这补充了我们之前的稳定性和位置重复性测量,表明MEMS DMs驱动到亚纳米精度,因此在开环中是可控的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterizing MEMS deformable mirrors for open-loop operation: high-resolution measurements of thin-plate behavior
New concepts for astronomical adaptive optics are enabled by use of micro-electrical mechanical systems (MEMS) deformable mirrors (DMs). Unlike traditional DMs now used in astronomical AO systems, MEMS devices are smaller, less expensive, and exhibit extraordinarily repeatable actuation. Consequently, MEMS technology allows for novel configurations, such as multi-object AO, that require open-loop control of multiple DMs. At the UCO/Lick Observatory Laboratory for Adaptive Optics we are pursuing this concept in part by creating a phaseto- voltage model for the MEMS DM. We model the surface deflection approximately by the thin-plate equation. Using this modeling technique, we have achieved open-loop control accuracy in the laboratory to ~13-30 nm surface rms in response to ~1-3 μm peak-to-valley commands, respectively. Next, high-resolution measurements of the displacement between actuator posts are compared to the homogeneous solution of the thin-plate equation, to verify the model's validity. These measurements show that the thin-plate equation seems a plausible approach to modeling deformations of the top surface down to lateral scales of a tenth actuator spacing. Finally, in order to determine the physical lower limit to which our model can be expected to be accurate, we conducted a set of hysteresis experiments with a MEMS. We detect only a sub-nanometer amount of hysteresis of 0.6±0.3 nm surface over a 160-volt loop. This complements our previous stability and position repeatability measurements, showing that MEMS DMs actuate to sub-nanometer precision and are hence controllable in open-loop.
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