基于改进混合保护技术的高效容错寄存器设计

Meghana M Katti, Sonali Agrawal
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引用次数: 2

摘要

本文提出了改进的混合保护技术,利用三模冗余(TMR)、单纠错(SEC)码和双错误检测(DED)码的组合来设计容错寄存器,这是由于当今由于辐射而产生的软错误所必需的。使用这些技术时,电路面积、功耗和时序是主要的制约因素,当应用于专用集成电路(ASIC)时,主要取决于设计要求。本文提出了改进的混合技术- i的思想,它引入了对寄存器的高活度位的TMR和对低活度位的SEC-SEC的组合,以及改进的混合技术- ii,它在高活度位上应用TMR,在低活度位上应用SEC-DED,基于阈值,根据活度因子划分寄存器。与现有的混合保护技术相比,改进的混合保护技术I和II的功率开销分别降低了24.5%和64.7%,从而实现了任何寄存器中可以校正的比特数的增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of Power Efficient Fault Tolerant Registers using Modified Hybrid Protection Technique
This paper proposes modified Hybrid Protection techniques to design fault tolerant registers using combination of Triple Modular Redundancy (TMR), Single Error Correcting (SEC) codes and Double Error Detecting (DED) codes, which are necessary to be implemented because of the modern-day soft errors that occur due to radiation. Using these techniques, the circuit area, consumption of power and timing are main constraints, when applied on Application Specific Integrated Circuits (ASIC) which is mainly dependent on design requirements. This paper brings in the idea of modified Hybrid Technique-I which introduces a combination of TMR on higher activity bits of a register and SEC-SEC on lower activity bits, and modified Hybrid Technique-II where TMR is applied on higher activity bits and SEC-DED on lower activity bits based on the threshold, set for division of register with respect to activity factor. This leads to the achievement of increase in number of bits which can be corrected in any register with 24.5% and 64.7% decrease in power overhead in modified Hybrid technique I and II respectively as compared to existing hybrid protection technique.
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