{"title":"[标题页iii]","authors":"","doi":"10.1109/icced.2018.00002","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":398146,"journal":{"name":"2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"[Title page iii]\",\"authors\":\"\",\"doi\":\"10.1109/icced.2018.00002\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":398146,\"journal\":{\"name\":\"2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/icced.2018.00002\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icced.2018.00002","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}