2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest) - 最新文献
Pub Date : 2020-09-13
DOI: 10.1109/FailFest51498.2020.00005
Sunwoo Ha, Adam Kern, Melanie Bancilhon, Alvitta Ottley
Pub Date : 2018-09-01
DOI: 10.1109/icced.2018.00002
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