用于ExoMars 2020任务的dsPIC微控制器的重离子锁存测试

2017 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2017-07-01 DOI:10.1109/NSREC.2017.8115481

P. Manzano, M. Álvarez, S. Sampedro, M. Rivas, I. Traseira, J. Manzano, J. R. Mingo, A. Martín-Ortega, N. Andrés

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引用次数: 3

摘要

为了分析其在ExoMars 2020任务中的适用性，在Microchip微控制器dsPIC30F6014A上进行了重离子闭锁测试。SEL率的估计显示了微控制器对非关键功能的适用性。

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Heavy ion latch-up test on dsPIC microcontroller to be used in ExoMars 2020 mission

Heavy ion latch-up test on Microchip microcontroller dsPIC30F6014A has been performed in order to analyze its suitability for ExoMars 2020 mission. The estimation of SEL rate shows the applicability of the microcontroller for non-critical functions.

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2017 IEEE Radiation Effects Data Workshop (REDW)

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