超大规模集成电路制造在日本和美国

D. Hodges
{"title":"超大规模集成电路制造在日本和美国","authors":"D. Hodges","doi":"10.1109/ASMC.1990.111211","DOIUrl":null,"url":null,"abstract":"Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed.<<ETX>>","PeriodicalId":158760,"journal":{"name":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"VLSI manufacturing in Japan and the United States\",\"authors\":\"D. Hodges\",\"doi\":\"10.1109/ASMC.1990.111211\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed.<<ETX>>\",\"PeriodicalId\":158760,\"journal\":{\"name\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1990.111211\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1990.111211","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

对日本的超大规模集成电路(VLSI)制造技术与美国进行了比较。讨论了工厂设计,雇佣实践,随机与因果产量波动,过程控制和生产率,以及计算机集成制造(CIM)系统。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
VLSI manufacturing in Japan and the United States
Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信