逐次逼近ADC的故障与诊断

IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI:10.1109/IMTC.1997.612441

F. Marc, D. Dallet, Y. Danto

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引用次数: 5

摘要

在逐次逼近A/D转换器中，如果满足一定条件，则通过直方图计算的误码来定位故障的根源。在本文中，我们给出了一个故障的a /D转换器的实际情况，其误码是不可计算的。因此，使用包括外部电表征和电子束测试(EBT)在内的替代方法进行故障定位。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Fault and diagnosis on a successive approximation ADC

In successive approximation A/D converters, the origin of failure is located through the bit error which is computed from the histogram, if it fulfil some conditions. In this paper, we present the real case of a failing A/D converter whose bit error is not computable. Consequently, the failure localization is performed using an alternative methodology including external electrical characterization and electron beam testing (EBT).

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IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings

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