利用光电电子显微镜测量Nd-oxide/W(100)表面的功函数

2011 24th International Vacuum Nanoelectronics Conference Pub Date : 1900-01-01 DOI:10.1109/ivnc.2015.7225550

H. Nakane, T. Kitaguchi, T. Kawakubo

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引用次数: 0

摘要

为了实现高性能的电子源，需要一种低功函数的正极材料。利用光电子显微镜测量了Nd2O3修饰W(100)表面的功函数。测得Nd-oxide的功函数为2.5eV /W(100)。

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Work function measurement of Nd-oxide/W(100) surface by using of photoemission electron microscope

A cathode material of a low work function is needed to achieve a high performance electron source. We measured the work function of W(100) surface modified with Nd2O3 by using of photoemission electron microscope. The work function of Nd-oxide/W(100) surface is measured to be 2.5eV.

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2011 24th International Vacuum Nanoelectronics Conference

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