{"title":"Q20D080模拟RAM逻辑阵列","authors":"C. Blake, M. Hollabaugh","doi":"10.1109/CICC.1989.56762","DOIUrl":null,"url":null,"abstract":"An ECL (emitter-coupled logic)-structured array containing 1520 logic cells, 2560 bits of RAM, and a customizable analog section is described. The special needs of high performance VLSI testers was the driving force behind its organization and architecture. The chip is fabricated with a trench isolation bipolar process with 1-μm features, double layers of polysilicon, and triple layers of metallization","PeriodicalId":165054,"journal":{"name":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Q20D080 analog RAM logic array\",\"authors\":\"C. Blake, M. Hollabaugh\",\"doi\":\"10.1109/CICC.1989.56762\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An ECL (emitter-coupled logic)-structured array containing 1520 logic cells, 2560 bits of RAM, and a customizable analog section is described. The special needs of high performance VLSI testers was the driving force behind its organization and architecture. The chip is fabricated with a trench isolation bipolar process with 1-μm features, double layers of polysilicon, and triple layers of metallization\",\"PeriodicalId\":165054,\"journal\":{\"name\":\"1989 Proceedings of the IEEE Custom Integrated Circuits Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1989 Proceedings of the IEEE Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.1989.56762\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1989.56762","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An ECL (emitter-coupled logic)-structured array containing 1520 logic cells, 2560 bits of RAM, and a customizable analog section is described. The special needs of high performance VLSI testers was the driving force behind its organization and architecture. The chip is fabricated with a trench isolation bipolar process with 1-μm features, double layers of polysilicon, and triple layers of metallization