无故障发现对模拟CMOS电路的影响

J. Wan, H. Kerkhoff
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引用次数: 10

摘要

电子系统中最困难的故障类别是“无故障发现”(NFF)。例如,它被认为是航空电子设备中代价最高的故障类别。这一领域相对较少的论文很少涉及模拟集成系统。本文建立了一种特殊类型的NFF的简单仿真模型,即由不良互连引起的间歇性电阻性故障。对NFFs影响下的CMOS运算放大器进行了仿真,并对其在不同故障条件下的行为进行了研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The influence of No Fault Found in analogue CMOS circuits
The most difficult fault category in electronic systems is the “No Fault Found” (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.
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