NASA候选航天器电子设备的单事件效应、总电离剂量和位移损伤简编

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004560

K. Label, M. O’Bryan, Dakai Chen, M. Campola, M. Casey, J. Pellish, J. Lauenstein, E. Wilcox, Alyson D. Topper, R. Ladbury, M. Berg, Robert A. Gigliuto, A. Boutte, Donna J. Cochran, S. Buchner, D. Violette

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引用次数: 5

摘要

我们提出了辐射对各种候选航天器电子设备的影响的结果和分析，以质子和重离子诱导的单事件效应(SEE)，质子诱导的位移损伤(DD)和总电离剂量(TID)。本文是对试验结果的总结。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects (SEE), proton-induced displacement damage (DD), and total ionizing dose (TID). This paper is a summary of test results.

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来源期刊

2014 IEEE Radiation Effects Data Workshop (REDW)

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