{"title":"组合序列在线自诊断硬件的发展","authors":"Miguel Garvie, A. Thompson","doi":"10.1109/EH.2003.1217663","DOIUrl":null,"url":null,"abstract":"The evolution of circuits with online built-in self-test is attempted in simulation for a full adder, two-bit multiplier and edge triggered D-latch. Results show that the evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.","PeriodicalId":134823,"journal":{"name":"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Evolution of combinatorial and sequential online self-diagnosing hardware\",\"authors\":\"Miguel Garvie, A. Thompson\",\"doi\":\"10.1109/EH.2003.1217663\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The evolution of circuits with online built-in self-test is attempted in simulation for a full adder, two-bit multiplier and edge triggered D-latch. Results show that the evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.\",\"PeriodicalId\":134823,\"journal\":{\"name\":\"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-07-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EH.2003.1217663\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EH.2003.1217663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evolution of combinatorial and sequential online self-diagnosing hardware
The evolution of circuits with online built-in self-test is attempted in simulation for a full adder, two-bit multiplier and edge triggered D-latch. Results show that the evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.
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