同时开关噪声对高速I/O信号眼图的影响

S. R. Chan, F. Tan, R. Mohd-Mokhtar
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引用次数: 7

摘要

同时开关噪声(SSN)随着I/O数据速率的提高而增加,给电源电压噪声的调节带来了更多的挑战。SSN增加了高速接口电路的抖动,限制了I/O的性能。为了减小SSN对供电电压下降的影响,必须对配电网进行优化设计。PDN的设计目标是降低输入输出电路的电源噪声。工程工作集中在封装和电路板布线上,以便在设计规范范围内控制阻抗轮廓和供电电压下降。本文讨论了下一阶段的研究,量化电源噪声对I/O晶体管级电路性能的影响,特别是对通用串行总线(USB)发送电路。在整个PDN存在电源噪声的情况下,USB传输信号的输出如图所示。结果表明,与目标PDN设计相比,USB发射电路可以承受更高的电源噪声降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simultaneous switching noise impact to signal eye diagram on high-speed I/O
Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into more challenges in regulating supply voltage noise. SSN increases jitter in high-speed interface circuit and limits the performance of I/O. In order to reduce SSN effect to supply voltage droop, Power Distribution Network (PDN) has to be designed optimally. PDN design goal is to reduce the power supply noise going into I/O circuit. Engineering efforts are focused on packaging and board routing in order to control the impedance profile and supply voltage droop within the design specification. This paper discusses the next level of investigation, quantifying the effect of supply noise to the I/O transistor level circuit performance, specifically on Universal Serial Bus (USB) transmitter circuit. Output of the USB's transmitted signal is shown in eye diagram with the existence of supply noise throughout PDN. Results show that the USB transmitter circuit can sustain with higher supply noise drop than the targeted PDN design.
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