J. Fabero, Golnaz Korkian, F. J. Franco, H. Mecha, M. Letiche, J. A. Clemente
{"title":"不同入射角下基于COTS 28nm sram FPGA的热中子诱导seu","authors":"J. Fabero, Golnaz Korkian, F. J. Franco, H. Mecha, M. Letiche, J. A. Clemente","doi":"10.1109/LATS53581.2021.9651879","DOIUrl":null,"url":null,"abstract":"This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) SRAM-based FPGA. Experimental results showing Single Event Upsets (SEUs) on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are provided and discussed. Shapes of multiple events (of various multiplicities) are also analyzed, as well as their dependency with the incident angle of the particle beam against the device's surface.","PeriodicalId":404536,"journal":{"name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles\",\"authors\":\"J. Fabero, Golnaz Korkian, F. J. Franco, H. Mecha, M. Letiche, J. A. Clemente\",\"doi\":\"10.1109/LATS53581.2021.9651879\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) SRAM-based FPGA. Experimental results showing Single Event Upsets (SEUs) on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are provided and discussed. Shapes of multiple events (of various multiplicities) are also analyzed, as well as their dependency with the incident angle of the particle beam against the device's surface.\",\"PeriodicalId\":404536,\"journal\":{\"name\":\"2021 IEEE 22nd Latin American Test Symposium (LATS)\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 22nd Latin American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATS53581.2021.9651879\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 22nd Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS53581.2021.9651879","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles
This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) SRAM-based FPGA. Experimental results showing Single Event Upsets (SEUs) on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are provided and discussed. Shapes of multiple events (of various multiplicities) are also analyzed, as well as their dependency with the incident angle of the particle beam against the device's surface.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
