在高地球轨道上查看两个静态32KB存储器的飞行数据

IEEE Radiation Effects Data Workshop Pub Date : 2002-12-10 DOI:10.1109/REDW.2002.1045524

S. Duzellier, S. Bourdarie, R. Velazco, B. Nicolescu, R. Ecoffet

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引用次数: 9

摘要

介绍了两个32kb sram在MPTB轨道上的单事件效应(SEE)测量结果。对事件率的主要贡献来自质子辐射带。在太阳活动期间，会发生卡比特现象，且SEU率与高能质子通量相关，但振幅不守恒。

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SEE in-flight data for two static 32KB memories on high earth orbit

SEE (single event effect) in-flight measurements are presented for two 32 kB SRAMs in the MPTB orbit. The major contribution to the event rates comes from the proton radiation belts. During solar events, stuck bits occurred and the SEU rate is correlated to the high energy proton flux but the amplitude is not conserved.

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IEEE Radiation Effects Data Workshop

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