大面积集成电路的产率统计

1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers Pub Date : 1900-01-01 DOI:10.1109/ISSCC.1986.1156918

C. Stapper

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引用次数: 16

摘要

本报告将涵盖泊松统计的检查和他们的不足，以表示在晶圆上的大面积芯片缺陷。将引用缺陷的测量，并讨论冗余方法的后果。

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Yield statistics for large area ICs

This report will cover an examination of Poisson statistics and their inadequacy to represent defects in large area chips on a wafer. Measurements of defects will be cited and the consequences on redundancy methods will be discussed.

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来源期刊

1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

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