基于电阻的抗pvt鲁棒PUF结构设计与评估

2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Pub Date : 2023-05-03 DOI:10.1109/DDECS57882.2023.10139352

Carl Riehm, Christoph Frisch, Florin Burcea, Matthias Hiller, Michael Pehl, R. Brederlow

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引用次数: 1

摘要

本文提出了一种新的完全兼容cmos的PUF原语，该原语基于电阻结构，对工艺变化、电源电压变化和温度漂移(PVT)具有鲁棒性，在电路级实现了先进的补偿机制。基于模拟仿真数据，对PUF的不可预测性和可靠性进行了评估。结果表明质量良好。进一步，提出了一种结构化的方法来设计合适的纠错，以说明整个PUF系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Structured Design and Evaluation of a Resistor-Based PUF Robust Against PVT-Variations

This paper proposes a new fully CMOS-compatible PUF primitive robust against process variations, supply voltage variations and temperature drift (PVT) based on resistive structures that implements advanced compensation mechanisms already on circuit level. Based on analog simulation data, the PUF is evaluated regarding its unpredictability and its reliability. The results indicate a high quality. Further, a structured approach for designing a suitable error correction is presented to illustrate the whole PUF system.

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来源期刊

2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

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