{"title":"功率亚微米异质结场效应晶体管的热阻","authors":"V. Timofeyev, E. Semenovskaya","doi":"10.1109/ELNANO.2013.6552007","DOIUrl":null,"url":null,"abstract":"The paper presents a method for thermal resistance calculating of power submicron heterojunction field-effect transistor. Described method establishes dependence of the thermal resistance of the transistor on its thermo- and electrophysical parameters, geometrical size and shape. The results of thermal resistance calculation for submicron transistors are proved by experiment and show good agreement.","PeriodicalId":443634,"journal":{"name":"2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Thermal resistance of power submicron heterojunction field-effect transistors\",\"authors\":\"V. Timofeyev, E. Semenovskaya\",\"doi\":\"10.1109/ELNANO.2013.6552007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a method for thermal resistance calculating of power submicron heterojunction field-effect transistor. Described method establishes dependence of the thermal resistance of the transistor on its thermo- and electrophysical parameters, geometrical size and shape. The results of thermal resistance calculation for submicron transistors are proved by experiment and show good agreement.\",\"PeriodicalId\":443634,\"journal\":{\"name\":\"2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELNANO.2013.6552007\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELNANO.2013.6552007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermal resistance of power submicron heterojunction field-effect transistors
The paper presents a method for thermal resistance calculating of power submicron heterojunction field-effect transistor. Described method establishes dependence of the thermal resistance of the transistor on its thermo- and electrophysical parameters, geometrical size and shape. The results of thermal resistance calculation for submicron transistors are proved by experiment and show good agreement.