{"title":"一种可实现低导通损耗和关断损耗的新型变导通IGBT","authors":"Yuxiao Yang, Wanjun Chen, Xinqi Sun, Xiaorui Xu, Yun Xia, Chao Liu, Zhaoji Li, Bo Zhang, Meng Wei, Ping Zhang, Zhong Ren","doi":"10.1109/ISPSD57135.2023.10147482","DOIUrl":null,"url":null,"abstract":"A novel low loss Insulated Gate Bipolar Transistor (IGBT) with variable conductance path (VCP) is proposed in this paper. The conductance of P-doped VCP is controlled by the depletion region generated around the depletion gate (DG). In the blocking state, VCP has high conductance and shorts P-well to the emitter. In the on-state, VCP has low conductance and the current can hardly flow through. Accordingly, the highly doped carrier stored (CS) layer would not affect the breakdown voltage (BV) of VCP-IGBT while it can effectively form the hole barrier to obtain low on-state voltage ($V_{on}$). In addition, when VCP-IGBT is turning off, the depletion region near DG vanished. VCP changes to the high-conductance state and extracts carriers directly out of the device, contributing to a low turn-off loss ($E_{off}$). Simulation results show that, under the same $E_{off}$, VCP-IGBT reduces $V_{on}$ by 20% compared to CSTBT and 17% compared to SBL-IGBT without decreasing static and dynamic blocking capability.","PeriodicalId":344266,"journal":{"name":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Novel IGBT with Variable Conductance Path Realizing Both Low $V_{on}$ and Turn-off Loss\",\"authors\":\"Yuxiao Yang, Wanjun Chen, Xinqi Sun, Xiaorui Xu, Yun Xia, Chao Liu, Zhaoji Li, Bo Zhang, Meng Wei, Ping Zhang, Zhong Ren\",\"doi\":\"10.1109/ISPSD57135.2023.10147482\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel low loss Insulated Gate Bipolar Transistor (IGBT) with variable conductance path (VCP) is proposed in this paper. The conductance of P-doped VCP is controlled by the depletion region generated around the depletion gate (DG). In the blocking state, VCP has high conductance and shorts P-well to the emitter. In the on-state, VCP has low conductance and the current can hardly flow through. Accordingly, the highly doped carrier stored (CS) layer would not affect the breakdown voltage (BV) of VCP-IGBT while it can effectively form the hole barrier to obtain low on-state voltage ($V_{on}$). In addition, when VCP-IGBT is turning off, the depletion region near DG vanished. VCP changes to the high-conductance state and extracts carriers directly out of the device, contributing to a low turn-off loss ($E_{off}$). Simulation results show that, under the same $E_{off}$, VCP-IGBT reduces $V_{on}$ by 20% compared to CSTBT and 17% compared to SBL-IGBT without decreasing static and dynamic blocking capability.\",\"PeriodicalId\":344266,\"journal\":{\"name\":\"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD57135.2023.10147482\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD57135.2023.10147482","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Novel IGBT with Variable Conductance Path Realizing Both Low $V_{on}$ and Turn-off Loss
A novel low loss Insulated Gate Bipolar Transistor (IGBT) with variable conductance path (VCP) is proposed in this paper. The conductance of P-doped VCP is controlled by the depletion region generated around the depletion gate (DG). In the blocking state, VCP has high conductance and shorts P-well to the emitter. In the on-state, VCP has low conductance and the current can hardly flow through. Accordingly, the highly doped carrier stored (CS) layer would not affect the breakdown voltage (BV) of VCP-IGBT while it can effectively form the hole barrier to obtain low on-state voltage ($V_{on}$). In addition, when VCP-IGBT is turning off, the depletion region near DG vanished. VCP changes to the high-conductance state and extracts carriers directly out of the device, contributing to a low turn-off loss ($E_{off}$). Simulation results show that, under the same $E_{off}$, VCP-IGBT reduces $V_{on}$ by 20% compared to CSTBT and 17% compared to SBL-IGBT without decreasing static and dynamic blocking capability.