{"title":"用低产量数字开关忆阻器仿真模拟忆阻器","authors":"Á. Rák, G. Cserey","doi":"10.1109/ECCTD.2013.6662250","DOIUrl":null,"url":null,"abstract":"In this paper, we propose circuits for emulating analog purpose memristors (APM) purely composed from digital switching memristors or digital purpose memristors (DPM). Our design is also robust against memristor defects therefore this can be applied even in low yield technology where defects occur at high probability. Our simulations show that the switching noise of the circuits decreases with the number of memristors and the production yield of the circuit is no lower than the production yield of the digital switching memristors.","PeriodicalId":342333,"journal":{"name":"2013 European Conference on Circuit Theory and Design (ECCTD)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Emulation of analog memristors using low yield digital switching memristors\",\"authors\":\"Á. Rák, G. Cserey\",\"doi\":\"10.1109/ECCTD.2013.6662250\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose circuits for emulating analog purpose memristors (APM) purely composed from digital switching memristors or digital purpose memristors (DPM). Our design is also robust against memristor defects therefore this can be applied even in low yield technology where defects occur at high probability. Our simulations show that the switching noise of the circuits decreases with the number of memristors and the production yield of the circuit is no lower than the production yield of the digital switching memristors.\",\"PeriodicalId\":342333,\"journal\":{\"name\":\"2013 European Conference on Circuit Theory and Design (ECCTD)\",\"volume\":\"81 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 European Conference on Circuit Theory and Design (ECCTD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2013.6662250\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 European Conference on Circuit Theory and Design (ECCTD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2013.6662250","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Emulation of analog memristors using low yield digital switching memristors
In this paper, we propose circuits for emulating analog purpose memristors (APM) purely composed from digital switching memristors or digital purpose memristors (DPM). Our design is also robust against memristor defects therefore this can be applied even in low yield technology where defects occur at high probability. Our simulations show that the switching noise of the circuits decreases with the number of memristors and the production yield of the circuit is no lower than the production yield of the digital switching memristors.