用低产量数字开关忆阻器仿真模拟忆阻器

Á. Rák, G. Cserey
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引用次数: 1

摘要

在本文中,我们提出了模拟纯由数字开关忆阻器或数字目的忆阻器(DPM)组成的模拟目的忆阻器的电路。我们的设计对忆阻器缺陷也很强大,因此即使在低产量技术中,缺陷也很可能发生。仿真结果表明,电路的开关噪声随忆阻器个数的增加而减小,且电路的产率不低于数字开关忆阻器的产率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Emulation of analog memristors using low yield digital switching memristors
In this paper, we propose circuits for emulating analog purpose memristors (APM) purely composed from digital switching memristors or digital purpose memristors (DPM). Our design is also robust against memristor defects therefore this can be applied even in low yield technology where defects occur at high probability. Our simulations show that the switching noise of the circuits decreases with the number of memristors and the production yield of the circuit is no lower than the production yield of the digital switching memristors.
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