用于介质隔离技术的高速多晶硅沉积工艺

S. Itoh, T. Usui, K. Akahane, N. Ishikawa, T. Yokoyama, Y. Maeda
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引用次数: 1

摘要

本文介绍了一种新开发的高速多晶硅沉积工艺,该工艺将熔融硅喷涂在衬底上并固化。利用该工艺,仅在几分钟内就沉积了500pn厚的硅片层,该硅片层作为介质隔离衬底的机械支撑。讨论了多晶硅在v型槽中的填充、衬底的曲率以及衬底中引起的位错。文中还描述了用这种工艺制作的高压LSI的特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High speed polysilicon deposition process for dielectric isolation technology
ABS" This paper describes a newly developed high speed polysilicon deposition process in which molten silicon is sprayed on a substrate and solidified. By utilizing this process, a 500pn thick plysilicon layer which acts as a mechanical support of dielectrically isolated substrate was deposited in only a few minutes. Filling of the polysilicon in V-grooves, curvature of substrates, and dislocations induced in substrates are discussed. The characteristics of a high voltage LSI fabricated using this process is also described.
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