{"title":"具有完全分段动态元件匹配的14b 100MS/s DAC","authors":"Kok Lim Chan, I. Galton","doi":"10.1109/ISSCC.2006.1696302","DOIUrl":null,"url":null,"abstract":"A 14b 100MS/s Nyquist-rate DAC using a segmented dynamic-element-matching technique involving all the DAC elements is demonstrated. The DAC is implemented in a 0.18mum CMOS process and worst-case SFDRs across Nyquist bands are 74.4dB and 78.9dB for sample-rates of 100MS/s and 70Ms/s, respectively","PeriodicalId":166617,"journal":{"name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"38","resultStr":"{\"title\":\"A 14b 100MS/s DAC with Fully Segmented Dynamic Element Matching\",\"authors\":\"Kok Lim Chan, I. Galton\",\"doi\":\"10.1109/ISSCC.2006.1696302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 14b 100MS/s Nyquist-rate DAC using a segmented dynamic-element-matching technique involving all the DAC elements is demonstrated. The DAC is implemented in a 0.18mum CMOS process and worst-case SFDRs across Nyquist bands are 74.4dB and 78.9dB for sample-rates of 100MS/s and 70Ms/s, respectively\",\"PeriodicalId\":166617,\"journal\":{\"name\":\"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"38\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2006.1696302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2006.1696302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 38
摘要
采用分段动态元件匹配技术的14b 100MS/s奈奎斯特速率DAC涉及所有DAC元件的演示。该DAC采用0.18 μ m CMOS工艺实现,采样率为100MS/s和70Ms/s时,Nyquist频带的最坏情况sfdr分别为74.4dB和78.9dB
A 14b 100MS/s DAC with Fully Segmented Dynamic Element Matching
A 14b 100MS/s Nyquist-rate DAC using a segmented dynamic-element-matching technique involving all the DAC elements is demonstrated. The DAC is implemented in a 0.18mum CMOS process and worst-case SFDRs across Nyquist bands are 74.4dB and 78.9dB for sample-rates of 100MS/s and 70Ms/s, respectively