{"title":"行为水平测试开发","authors":"William A. Johnson","doi":"10.1109/DAC.1979.1600105","DOIUrl":null,"url":null,"abstract":"An argument is made that the economics of test development in the LSI-VLSI era require creation and use of test development software aids that operate from high-level behavioral circuit models. Behavioral models are defined to be abstract specifications of the circuit function. Problems with the use of current-day gate-level software aids are discussed. Suggestions are given for implementing behavioral-level test generation tools. Recent work in this area at Texas Instruments Incorporated (TI) is discussed.","PeriodicalId":345241,"journal":{"name":"16th Design Automation Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Behavioral-Level Test Development\",\"authors\":\"William A. Johnson\",\"doi\":\"10.1109/DAC.1979.1600105\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An argument is made that the economics of test development in the LSI-VLSI era require creation and use of test development software aids that operate from high-level behavioral circuit models. Behavioral models are defined to be abstract specifications of the circuit function. Problems with the use of current-day gate-level software aids are discussed. Suggestions are given for implementing behavioral-level test generation tools. Recent work in this area at Texas Instruments Incorporated (TI) is discussed.\",\"PeriodicalId\":345241,\"journal\":{\"name\":\"16th Design Automation Conference\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1979.1600105\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1979.1600105","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An argument is made that the economics of test development in the LSI-VLSI era require creation and use of test development software aids that operate from high-level behavioral circuit models. Behavioral models are defined to be abstract specifications of the circuit function. Problems with the use of current-day gate-level software aids are discussed. Suggestions are given for implementing behavioral-level test generation tools. Recent work in this area at Texas Instruments Incorporated (TI) is discussed.
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