超越摩尔:GaN hemt和Si CMOS结合在一起

T. Kazior, J. LaRoche, W. Hoke
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引用次数: 17

摘要

硅技术的进步继续给微电子技术带来革命。然而,硅不能做所有的事情,需要基于其他材料系统的电路。整合这些不同的材料并增强Si的能力,从而继续微电子革命的最佳方法是什么?在本文中,我们总结了我们使用类似于SiGe BiCMOS工艺的集成/制造工艺在普通硅衬底上成功集成GaN hemt与Si CMOS的结果。我们的GaN - Si CMOS工艺正在被缩放到200毫米直径的晶圆,并与缩放的CMOS集成,用于制造带有片上数字控制/校准的RF和混合信号电路。因此,GaN与Si CMOS的异构集成使一类新的高性能ic能够增强现有系统的能力,实现新的电路架构,并促进低成本微电子的持续扩散,用于广泛的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
More Than Moore: GaN HEMTs and Si CMOS Get It Together
Advances in silicon technology continue to revolutionize microelectronics. However, Si cannot do everything and circuits based on other materials systems are required. What is the best way to integrate these dissimilar materials and enhance the capabilities of Si, thereby continuing the microelectronics revolution? In this paper, we summarize our results on the successful integration of GaN HEMTs with Si CMOS on a common silicon substrate using an integration/fabrication process similar to a SiGe BiCMOS process. Our GaN - Si CMOS process is being scaled to 200 mm diameter wafers and integrated with scaled CMOS and used to fabricate RF and mixed signals circuits with on-chip digital control/calibration. Thus, heterogeneous integration of GaN with Si CMOS enables a new class of high performance ICs that enhance the capabilities of existing systems, enable new circuit architectures and facilitate the continued proliferation of low cost microelectronics for a wide range of applications.
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