线性电路的高效参数良率估计

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) Pub Date : 2000-05-14 DOI:10.1109/ICMEL.2000.838781

T. Ilic, V.B. Lirovski

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引用次数: 1

摘要

本文介绍了一种新的有效的线性电路统计分析方法，当元件公差给定时。该方法可同时处理大小公差值。对于每个频率/时间点，只需要对整个系统矩阵进行一次LU分解。在此基础上开发了公差模拟器，包括适合观察统计特性的图形后处理器和电路的良率。

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Computationally efficient parametric yield estimation of linear electronic circuits

This paper recommends a new efficient method for statistical analysis of linear electronic circuits, when elements tolerances are given. The method copes with small and large tolerance values equally. Only one LU factorization of system matrix as whole is necessary, for each frequency/time point. Tolerance simulator was developed on the bases of this method, including graphical postprocessor suitable for observing statistical characteristics, and yield of a circuit.

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2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)

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