Zhao-Bin Wang, Zhoulin Huang, Jiawei Wang, Shang Shang, G. Zhai
{"title":"电磁继电器在加速存储退化试验中的失效机理","authors":"Zhao-Bin Wang, Zhoulin Huang, Jiawei Wang, Shang Shang, G. Zhai","doi":"10.1109/HOLM.2017.8088080","DOIUrl":null,"url":null,"abstract":"The most past research on storage reliability of electromagnetic relay (EMR) only focuses on the measurement of contact resistance. The relay time parameters which reflect main performance function were not monitored. So, in this study the relay time parameters and relay contact resistance were detected simultaneously. The method of prognostics and health management (PHM) was used. According to the analysis on test results of contact resistance, relay time parameters, the degradation phenomena of EMR in long-term storage are investigated, and the storage failure mechanism is analyzed. The microscopic morphology and changes in chemical elements for relay contact surface was analyzed, which provide references for the relay storage failure mechanisms.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"The failure mechanism of electromagnetic relay in accelerated storage degradation testing\",\"authors\":\"Zhao-Bin Wang, Zhoulin Huang, Jiawei Wang, Shang Shang, G. Zhai\",\"doi\":\"10.1109/HOLM.2017.8088080\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The most past research on storage reliability of electromagnetic relay (EMR) only focuses on the measurement of contact resistance. The relay time parameters which reflect main performance function were not monitored. So, in this study the relay time parameters and relay contact resistance were detected simultaneously. The method of prognostics and health management (PHM) was used. According to the analysis on test results of contact resistance, relay time parameters, the degradation phenomena of EMR in long-term storage are investigated, and the storage failure mechanism is analyzed. The microscopic morphology and changes in chemical elements for relay contact surface was analyzed, which provide references for the relay storage failure mechanisms.\",\"PeriodicalId\":354484,\"journal\":{\"name\":\"2017 IEEE Holm Conference on Electrical Contacts\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2017.8088080\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2017.8088080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The failure mechanism of electromagnetic relay in accelerated storage degradation testing
The most past research on storage reliability of electromagnetic relay (EMR) only focuses on the measurement of contact resistance. The relay time parameters which reflect main performance function were not monitored. So, in this study the relay time parameters and relay contact resistance were detected simultaneously. The method of prognostics and health management (PHM) was used. According to the analysis on test results of contact resistance, relay time parameters, the degradation phenomena of EMR in long-term storage are investigated, and the storage failure mechanism is analyzed. The microscopic morphology and changes in chemical elements for relay contact surface was analyzed, which provide references for the relay storage failure mechanisms.