{"title":"CMOS兼容光电二极管的电光特性研究","authors":"G. Soncini, M. Zen, M. Rudan, G. Verzellesi","doi":"10.1109/MELCON.1991.161791","DOIUrl":null,"url":null,"abstract":"A numerical model for the solution of semiconductor-device equations in the presence of an optical-generation effect is presented. This model, developed as a part of the general-purpose semiconductor-device analysis program HFIELDS, is to be applied to the analysis of optical sensors used in semiconductor integrated imagers. Preliminary theoretical results on CMOS-compatible photodiodes are presented and compared with experiments.<<ETX>>","PeriodicalId":193917,"journal":{"name":"[1991 Proceedings] 6th Mediterranean Electrotechnical Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"On the electro-optical characteristics of CMOS compatible photodiodes\",\"authors\":\"G. Soncini, M. Zen, M. Rudan, G. Verzellesi\",\"doi\":\"10.1109/MELCON.1991.161791\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A numerical model for the solution of semiconductor-device equations in the presence of an optical-generation effect is presented. This model, developed as a part of the general-purpose semiconductor-device analysis program HFIELDS, is to be applied to the analysis of optical sensors used in semiconductor integrated imagers. Preliminary theoretical results on CMOS-compatible photodiodes are presented and compared with experiments.<<ETX>>\",\"PeriodicalId\":193917,\"journal\":{\"name\":\"[1991 Proceedings] 6th Mediterranean Electrotechnical Conference\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991 Proceedings] 6th Mediterranean Electrotechnical Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MELCON.1991.161791\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] 6th Mediterranean Electrotechnical Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MELCON.1991.161791","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the electro-optical characteristics of CMOS compatible photodiodes
A numerical model for the solution of semiconductor-device equations in the presence of an optical-generation effect is presented. This model, developed as a part of the general-purpose semiconductor-device analysis program HFIELDS, is to be applied to the analysis of optical sensors used in semiconductor integrated imagers. Preliminary theoretical results on CMOS-compatible photodiodes are presented and compared with experiments.<>