一种实现多种子、多多项式线性反馈移位寄存器的测试处理器芯片

Proceedings Sixth Asian Test Symposium (ATS'97) Pub Date : 1997-11-17 DOI:10.1109/ATS.1997.643952

Z. M. Darus, I. Ahmed, L. Ali

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引用次数: 6

摘要

提出了一种实现多种子、多多项式线性反馈移位寄存器(MPMSLFSR)的低成本测试处理器ASIC芯片的设计。在芯片的模式发生器中可设置用户可编程种子和反馈连接，以提高故障覆盖率。ASIC还支持扫描路径测试。也可用于外部IC测试仪的设计。

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A test processor chip implementing multiple seed, multiple polynomial linear feedback shift register

This paper presents the design of a low cost, test processor ASIC chip implementing multiple seed, multiple polynomial linear feedback shift register (MPMSLFSR). User programmable seed and feedback connection can be set in the pattern generator of the chip to improve fault coverage. The ASIC also supports scan-path testing. It can also be used to design external IC tester.

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Proceedings Sixth Asian Test Symposium (ATS'97)

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