在制造环境中最大限度地提高和保持交流测试精度

R. Bulaga, Edward F. Westermann
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引用次数: 1

摘要

在阵列测试中,对亚纳秒(ns)测试精度的需求尤其迫切,其中可能只存在几百皮秒(ps)的余量。当测试器必须在制造环境中运行时,最大限度地提高测试器精度的挑战就增加了,在这种环境中,容量和精度一样重要。这至少部分地解释了为什么某种形式的自动校准是几乎所有现代测试设备的标准配置。尽管有自动校准,但在批量生产环境中实现准确的交流测试结果仍然是一个难以实现的目标。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
MAXIMIZING AND MAINTAINING AC TEST ACCURACY IN THE MANUFACTURING ENVIRONMENT
The need for sub-nanosecond (ns) test accuracy is especially acute in array testing, where margins of only a few hundred picoseconds (ps) may exist. The challenge of maximizing tester accuracy is increased when the tester must perform in a manufacturing environment, where capacity is as important as accuracy. This, at least partially, explains why some form of autocalibration is standard on virtually all modcrn test equipment. In spite of autocalibration, achieving accurate AC test iesults ui a volume manufacturing environment remains an elusive goal.
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