{"title":"在制造环境中最大限度地提高和保持交流测试精度","authors":"R. Bulaga, Edward F. Westermann","doi":"10.1109/TEST.1991.519764","DOIUrl":null,"url":null,"abstract":"The need for sub-nanosecond (ns) test accuracy is especially acute in array testing, where margins of only a few hundred picoseconds (ps) may exist. The challenge of maximizing tester accuracy is increased when the tester must perform in a manufacturing environment, where capacity is as important as accuracy. This, at least partially, explains why some form of autocalibration is standard on virtually all modcrn test equipment. In spite of autocalibration, achieving accurate AC test iesults ui a volume manufacturing environment remains an elusive goal.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"87 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"MAXIMIZING AND MAINTAINING AC TEST ACCURACY IN THE MANUFACTURING ENVIRONMENT\",\"authors\":\"R. Bulaga, Edward F. Westermann\",\"doi\":\"10.1109/TEST.1991.519764\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The need for sub-nanosecond (ns) test accuracy is especially acute in array testing, where margins of only a few hundred picoseconds (ps) may exist. The challenge of maximizing tester accuracy is increased when the tester must perform in a manufacturing environment, where capacity is as important as accuracy. This, at least partially, explains why some form of autocalibration is standard on virtually all modcrn test equipment. In spite of autocalibration, achieving accurate AC test iesults ui a volume manufacturing environment remains an elusive goal.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"87 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519764\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519764","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
MAXIMIZING AND MAINTAINING AC TEST ACCURACY IN THE MANUFACTURING ENVIRONMENT
The need for sub-nanosecond (ns) test accuracy is especially acute in array testing, where margins of only a few hundred picoseconds (ps) may exist. The challenge of maximizing tester accuracy is increased when the tester must perform in a manufacturing environment, where capacity is as important as accuracy. This, at least partially, explains why some form of autocalibration is standard on virtually all modcrn test equipment. In spite of autocalibration, achieving accurate AC test iesults ui a volume manufacturing environment remains an elusive goal.