Xilinx 28纳米Virtex-7 fpga选定架构特征的动态SEE测试

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696210

G. Swift, S. Stone, S. E. García, Kevin W. Wray, W. Rowe, Krysten H. Pfau, Robert Liu, J. Holden, Asa Angeles, Barry L. Willits, Kyle P. Robinson, Andrés Pérez-Celis, M. Wirthlin

{"title":"Xilinx 28纳米Virtex-7 fpga选定架构特征的动态SEE测试","authors":"G. Swift, S. Stone, S. E. García, Kevin W. Wray, W. Rowe, Krysten H. Pfau, Robert Liu, J. Holden, Asa Angeles, Barry L. Willits, Kyle P. Robinson, Andrés Pérez-Celis, M. Wirthlin","doi":"10.1109/RADECS.2017.8696210","DOIUrl":null,"url":null,"abstract":"Recent proton and heavy ion SEE data are presented for selected Virtex-7 architectural features requiring dynamic in-beam testing: I/O blocks in various modes, IOSERDES, digital- and phase-locked loop clocks, and block memory’s error correction circuitry.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAs\",\"authors\":\"G. Swift, S. Stone, S. E. García, Kevin W. Wray, W. Rowe, Krysten H. Pfau, Robert Liu, J. Holden, Asa Angeles, Barry L. Willits, Kyle P. Robinson, Andrés Pérez-Celis, M. Wirthlin\",\"doi\":\"10.1109/RADECS.2017.8696210\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recent proton and heavy ion SEE data are presented for selected Virtex-7 architectural features requiring dynamic in-beam testing: I/O blocks in various modes, IOSERDES, digital- and phase-locked loop clocks, and block memory’s error correction circuitry.\",\"PeriodicalId\":223580,\"journal\":{\"name\":\"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.2017.8696210\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.2017.8696210","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

最近的质子和重离子SEE数据展示了需要动态束流内测试的Virtex-7架构特征:各种模式的I/O块，IOSERDES，数字和锁相环路时钟，以及块存储器的纠错电路。

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Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAs

Recent proton and heavy ion SEE data are presented for selected Virtex-7 architectural features requiring dynamic in-beam testing: I/O blocks in various modes, IOSERDES, digital- and phase-locked loop clocks, and block memory’s error correction circuitry.

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2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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