基于改进子集采样算法的单单元物理仿真

2017 International Conference on Circuits, System and Simulation (ICCSS) Pub Date : 2017-07-01 DOI:10.1109/CIRSYSSIM.2017.8023192

Zhu Ming, Kang He, Zhu Hengjing, Yu Qingkui, Sun Yi, Tang Min

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引用次数: 0

摘要

提出了一种改进的基于机器学习的子集采样算法。在SRAM的SEU截面上进行物理模拟，可以有效地模拟单粒子效应下的真实物理过程，减少模拟时间。仿真结果与实验结果吻合较好。该方法的有效性得到了验证。

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Based on improved subset sampling algorithm for SEU physical simulation

This paper proposes an improved subset sampling algorithm based on machine learning. The physical simulation is executed on SEU cross section of SRAM, which can effectively simulate the real physical process in the single particle effect and reduce the simulation time. The simulation results are good agreement with the experimental results. The proposed method is validly verified.

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来源期刊

2017 International Conference on Circuits, System and Simulation (ICCSS)

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