p型应变SiGe量子阱的磁输运性质

P. Coleridge, Y. Feng, H. Lafontaine, A. Sachrajda, R. Williams, P. Zawadzki
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引用次数: 0

摘要

简要介绍了硅锗合金集成到微电子器件中的方法。描述了一系列调制掺杂p型应变Si/sub .88/Ge/sub .12/量子阱的生长,并给出了低温磁输运表征的结果。对某些样品在低温下绝缘相的外观也作了评论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Magnetotransport properties of p-type strained SiGe quantum wells
A brief survey is given of ways SiGe alloys can be integrated into microelectronic devices. The growth of a series of modulation doped p-type strained Si/sub .88/Ge/sub .12/ quantum wells is described and the results of characterisation using low temperature magnetotransport presented. Comments are also made about the appearance, in some samples, of an insulating phase at low temperatures.
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