U. Grunewald, S. Müller-Pfeiffer
{"title":"市场概况:扫描力显微镜传感器","authors":"U. Grunewald, S. Müller-Pfeiffer","doi":"10.1002/1616-8984(199801)3:1<327::aid-seup327>3.0.co;2-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":154848,"journal":{"name":"Sensors Update","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Market Overview: Sensors for Scanning Force Microscopy\",\"authors\":\"U. Grunewald, S. Müller-Pfeiffer\",\"doi\":\"10.1002/1616-8984(199801)3:1<327::aid-seup327>3.0.co;2-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":154848,\"journal\":{\"name\":\"Sensors Update\",\"volume\":\"122 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sensors Update\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/1616-8984(199801)3:1<327::aid-seup327>3.0.co;2-1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensors Update","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/1616-8984(199801)3:1<327::aid-seup327>3.0.co;2-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0