{"title":"易于测试的图像算子:这类电路的进化打败了工程师","authors":"L. Sekanina, R. Ruzicka","doi":"10.1109/EH.2003.1217658","DOIUrl":null,"url":null,"abstract":"The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved \"salt and pepper\" noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.","PeriodicalId":134823,"journal":{"name":"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":"{\"title\":\"Easily testable image operators: the class of circuits where evolution beats engineers\",\"authors\":\"L. Sekanina, R. Ruzicka\",\"doi\":\"10.1109/EH.2003.1217658\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved \\\"salt and pepper\\\" noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.\",\"PeriodicalId\":134823,\"journal\":{\"name\":\"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-07-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EH.2003.1217658\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EH.2003.1217658","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Easily testable image operators: the class of circuits where evolution beats engineers
The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved "salt and pepper" noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.