{"title":"电机寄生槽电容的数值计算","authors":"J. Sarrió, C. Martis, F. Chauvicourt","doi":"10.1109/EPE50722.2020.9305616","DOIUrl":null,"url":null,"abstract":"Parasitic capacitive couplings in the machine slots act as an undesired leakage current path. This paper presents a method to compute lumped capacitance values and their distribution through 2D electrostatic finite-element simulation. The method is applied to a real machine slot with double layer. Turn-to-iron and inter-turn capacitive couplings show that negligible values appear between distant turns and turns not facing the slot walls and the iron. This reduction of the matrix size can be exploited on further high-frequency equivalent circuit representation. In addition, the influence of the insulation geometry and characteristics is studied.","PeriodicalId":250783,"journal":{"name":"2020 International Conference and Exposition on Electrical And Power Engineering (EPE)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Numerical Computation of Parasitic Slot Capacitances in Electrical Machines\",\"authors\":\"J. Sarrió, C. Martis, F. Chauvicourt\",\"doi\":\"10.1109/EPE50722.2020.9305616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Parasitic capacitive couplings in the machine slots act as an undesired leakage current path. This paper presents a method to compute lumped capacitance values and their distribution through 2D electrostatic finite-element simulation. The method is applied to a real machine slot with double layer. Turn-to-iron and inter-turn capacitive couplings show that negligible values appear between distant turns and turns not facing the slot walls and the iron. This reduction of the matrix size can be exploited on further high-frequency equivalent circuit representation. In addition, the influence of the insulation geometry and characteristics is studied.\",\"PeriodicalId\":250783,\"journal\":{\"name\":\"2020 International Conference and Exposition on Electrical And Power Engineering (EPE)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Conference and Exposition on Electrical And Power Engineering (EPE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPE50722.2020.9305616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Conference and Exposition on Electrical And Power Engineering (EPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPE50722.2020.9305616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Numerical Computation of Parasitic Slot Capacitances in Electrical Machines
Parasitic capacitive couplings in the machine slots act as an undesired leakage current path. This paper presents a method to compute lumped capacitance values and their distribution through 2D electrostatic finite-element simulation. The method is applied to a real machine slot with double layer. Turn-to-iron and inter-turn capacitive couplings show that negligible values appear between distant turns and turns not facing the slot walls and the iron. This reduction of the matrix size can be exploited on further high-frequency equivalent circuit representation. In addition, the influence of the insulation geometry and characteristics is studied.