A Novel Method for Built-In-Self-Test Architecture using Crypto Core in IoT

Internet of Things (IoT), is the most effective concept to connect the real world of things with the virtual world of information technology. Nowadays, IoT has great importance over the world. But power constraints, area constraints, security risks, and reliability issues are the major concern of IoT applications. The crypto core integrated with built-in-self-test architecture is mainly used for providing both data security and reliability requirements of the IoT application. Resource-constrained devices are mostly used in IoT applications, in the case of self-test architecture the basic problem is that its high hardware area overhead due to additional circuitry used for testing purposes. This work focuses on a novel technique for built-in-self-test architecture using crypto core. The lightweight PRESENT block cipher is used to overcome the data security issues in a resource-constrained environment. The proposed model incorporates both encryptions as well as decryption of the PRESENT cipher model by using an 80-bit key and 64-bit input data. The proposed design reduces hardware area overhead by using low cost and highly hardware efficient components like comparator and X-compactor, and also the self-test design reuses the crypto core as a Test Pattern Generator (TPG). The design is implemented in Xilinx ISE 14.7. The analysis of the proposed design gives less hardware area overhead, high throughput per slice, low power consumption, and high fault detection capability compared with the existing techniques. These analysis results indicate that the proposed design is suitable for testing resource-constrained IoT devices.