{"title":"具有源口袋和非对称栅极氧化物的电流增强双栅极TFET","authors":"Zhonghua Yu, Yunpeng Dong, Xinnan Lin, Lining Zhang","doi":"10.1109/INEC.2016.7589410","DOIUrl":null,"url":null,"abstract":"In this paper, asymmetric gate oxide and source pocket double-gate tunneling FET (DG TFET) structure is proposed to enhance the current drive. Compared with conventional DG-TFET, the proposed TFET has steeper average subthreshold swing (SS), larger on currents, smaller supply voltage. The reason of improvements is mainly attributed to the enhanced tunneling electric field high-k gate oxide brings and larger tunneling area caused by the source pocket.","PeriodicalId":416565,"journal":{"name":"2016 IEEE International Nanoelectronics Conference (INEC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Current enhanced double-gate TFET with source pocket and asymmetric gate oxide\",\"authors\":\"Zhonghua Yu, Yunpeng Dong, Xinnan Lin, Lining Zhang\",\"doi\":\"10.1109/INEC.2016.7589410\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, asymmetric gate oxide and source pocket double-gate tunneling FET (DG TFET) structure is proposed to enhance the current drive. Compared with conventional DG-TFET, the proposed TFET has steeper average subthreshold swing (SS), larger on currents, smaller supply voltage. The reason of improvements is mainly attributed to the enhanced tunneling electric field high-k gate oxide brings and larger tunneling area caused by the source pocket.\",\"PeriodicalId\":416565,\"journal\":{\"name\":\"2016 IEEE International Nanoelectronics Conference (INEC)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Nanoelectronics Conference (INEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INEC.2016.7589410\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Nanoelectronics Conference (INEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INEC.2016.7589410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Current enhanced double-gate TFET with source pocket and asymmetric gate oxide
In this paper, asymmetric gate oxide and source pocket double-gate tunneling FET (DG TFET) structure is proposed to enhance the current drive. Compared with conventional DG-TFET, the proposed TFET has steeper average subthreshold swing (SS), larger on currents, smaller supply voltage. The reason of improvements is mainly attributed to the enhanced tunneling electric field high-k gate oxide brings and larger tunneling area caused by the source pocket.