集成碳纳米管接触插头的CMOS技术

C. Prawoto, Suwen Li, M. Chan
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引用次数: 0

摘要

虽然在互连技术中已经提出了CMOS兼容碳纳米管工艺[1],但集成到工作有源器件尚未得到证明。现有的碳纳米管合成工作采用Ni催化剂使用ti基衬底[2]。然而,在先进技术节点中使用CNTs作为MOSFET接触插头需要在硅化镍(NiSi)源极和漏极上合成CNTs[3]。因此,本文提出了一种CMOS兼容的碳纳米管触点插头到MOSFET的集成工艺。利用Ni基催化剂的界面层,解决了从NiSi衬底生长碳纳米管的挑战。碳纳米管通孔与MOSFET集成的性能根据通孔电阻和IV特性进行了评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CMOS Technology with Integrated Carbon-Nanotube Contact Plugs
Although CMOS compatible CNT process in interconnect technology has been proposed [1], integration to a working active device has yet to be demonstrated. CNT synthesis in existing works employ the use of Ti-based substrate using Ni catalyst [2]. Nevertheless, the use of CNTs as MOSFET contact plugs in advanced technology node require the synthesis of CNTs on nickel silicided (NiSi) source and drain region [3]. Thus, in this paper, a CMOS compatible integration process of CNT contact plug to a MOSFET is proposed. The challenge of growing CNT from NiSi substrate is addressed using interfacial layer using Ni based catalyst. The performance of CNT vias integrated with a MOSFET is evaluated in terms of via resistance and IV characteristics.
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