硅的大面积飞秒激光烧蚀制备具有高性能CMOS-SOI射频功能的薄膜

Arun Bhaskar, J. Philippe, M. Berthomé, E. Okada, J. Robillard, D. Gloria, C. Gaquière, E. Dubois
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引用次数: 6

摘要

飞秒激光加工是一种越来越重要的工具,用于金属,半导体和电介质的控制蚀刻,附带损害最小。我们利用这种技术从绝缘体上硅(SOI)模具的处理衬底上局部去除硅。通过将激光去除与XeF2蚀刻相结合,我们创建了SP9T开关的薄膜,并在下面完全去除处理硅。这样做是为了减轻由电容耦合到处理器衬底引起的损耗和非线性产品。我们证明了采用所提出的方法可以改善开关的线性度和插入损耗(图9和图10)。这可能会对5G等未来无线应用产生潜在的兴趣。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Large-area femtosecond laser ablation of Silicon to create membrane with high performance CMOS-SOI RF functions
Femtosecond laser processing is a tool of increasing relevance for controlled etching of metals, semiconductors, and dielectrics with minimum collateral damage. We make use of this technique to remove silicon locally from the handler substrate of Silicon-on-Insulator (SOI) dies. By combining laser removal with XeF2 etching, we create thin membranes of SP9T switch, with the handler silicon completely removed underneath. This is done in order to mitigate the losses and non-linear products caused by capacitive coupling to the handler substrate. We demonstrate the improvement of linearity and insertion loss of a switch (Fig. 9 and Fig. 10) by employing the proposed method. This could be of potential interest for future wireless applications like 5G.
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