高温超导体——电学方面的考虑及其在微电子领域的可能应用

R. Dumcke, G. Fotheringham, H. Reichl
{"title":"高温超导体——电学方面的考虑及其在微电子领域的可能应用","authors":"R. Dumcke, G. Fotheringham, H. Reichl","doi":"10.1109/EEMTS.1988.75940","DOIUrl":null,"url":null,"abstract":"The impact of VLSI integration trends on the requirements of chip-to-chip interconnects is reviewed. The propagation of on-chip and off-chip interconnection systems at liquid nitrogen temperatures are discussed for signal and power lines. Material properties of high T/sub c/-superconductors are considered and the resulting changes for transmission-line properties of superconducting interconnects are pointed out. Possible applications and some open problems are discussed.<<ETX>>","PeriodicalId":137899,"journal":{"name":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High temperature superconductors-electrical considerations and possible applications in microelectronics\",\"authors\":\"R. Dumcke, G. Fotheringham, H. Reichl\",\"doi\":\"10.1109/EEMTS.1988.75940\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The impact of VLSI integration trends on the requirements of chip-to-chip interconnects is reviewed. The propagation of on-chip and off-chip interconnection systems at liquid nitrogen temperatures are discussed for signal and power lines. Material properties of high T/sub c/-superconductors are considered and the resulting changes for transmission-line properties of superconducting interconnects are pointed out. Possible applications and some open problems are discussed.<<ETX>>\",\"PeriodicalId\":137899,\"journal\":{\"name\":\"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EEMTS.1988.75940\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEMTS.1988.75940","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

综述了VLSI集成趋势对片对片互连需求的影响。讨论了片内和片外互连系统在液氮温度下的传输。考虑了高T/sub / c超导体的材料特性,指出了由此引起的超导互连线传输在线特性的变化。讨论了可能的应用和一些有待解决的问题
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High temperature superconductors-electrical considerations and possible applications in microelectronics
The impact of VLSI integration trends on the requirements of chip-to-chip interconnects is reviewed. The propagation of on-chip and off-chip interconnection systems at liquid nitrogen temperatures are discussed for signal and power lines. Material properties of high T/sub c/-superconductors are considered and the resulting changes for transmission-line properties of superconducting interconnects are pointed out. Possible applications and some open problems are discussed.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信